Equipment

In addition to accessing all the departmental electron microscopy facilities, the Electron Image Analysis group operates the following equipment:

JEOL JEM-2200MCO FEGTEM

JEOL JEM-2200-MCO-FEGTEM

Location: Begbroke Hirsch Building 317.10.40 (and 10.41 and 10.42)
Telephone extension: 83742

The JEOL JEM-2200MCO is a monochromated, double aberration corrected TEM/STEM instrument capable of routine sub-Angstrom resolution. The 2200MCO is equipped with a monochromated Schottky FEG source and aberration correctors fitted to the imaging and probe forming lenses. It operates at 200kV and 80kV.

The aberration correctors are designed by CEOS for correction to the third order. The TEM imaging system resolution is thus improved to 0.08nm. Similarly the size of the probe used for STEM imaging is reduced towards the 0.1nm level. 

There is an in-column Omega-type electron energy filter for forming electron energy loss spectra and energy filtered images. Images and spectra are recorded on a Gatan 4k by 4k Ultrascan CCD camera. There is also a JEOL EDX system and Faraday Cage. Operation of the microscope is performed via remote computer control. Particular attention has been paid to making the environment in the microscope room extremely stable. A piezo stage allows very fine control of the specimen position in x, y and z directions.

Dr Judy Kim is responsible for the scientific direction and support of the JEOL 2200MCO with the help of the Oxford Materials TSG group. 
Contact Judy Kim for inquiries about using this instrument for high resolution experimental work.