Dr Judy Kim

Senior Staff Scientist in Aberration Corrected Electron Microscopy
Industrial Visits Academic Organiser
BSc (Northwestern University), PhD (California, Davis)

Judy Kim works on materials characterization of 2D hexagonal materials via HRTEM focal series exit wave reconstruction. These 2D materials (such as graphene and h-BN) are an important new option for nanoscale devices and catalysis given their large surface areas and electronic properties. In order to achieve this experimental characterization work, we use aberration corrected TEM at lower doses, as the materials are often sensitive to the electron beam.

The JEOL 2200MCO TEM is managed and supported by Judy in conjunction with the Oxford Materials TSG group. This double aberration corrected TEM/STEM instrument is equipped with a monochromated gun and omega energy filter. See the instruments link in the left menu for more specifications.

Judy has previously worked in the Dynamic TEM field to achieve the first nanosecond-nanometer scale images using an electron packet as the probe. Her work focused on the characterization of the fast phase transition behavior in reactive multilayer foils.

Contact Details

30.23 Holder Building
Department of Materials, University of Oxford
Parks Road, Oxford, OX1 3PH
Telephone: 01865 273707
22000MCO Tel: 01865 283742
Fax: 01865 273789
E-mail: judy.kim@materials.ox.ac.uk



J.M. Borrego, J.S. Blazquez, S. Lozano-Perez, J.S. Kim, C.F. Conde, A. Conde,Structural relaxation in Fe(Co)SiAlGaPCB amorphous alloys, Journal of Alloys and Compounds, vol. 584, (Jan 2014), 607-610.

Alex W. Robertson, Barbara Montanari, Kuang He, Judy Kim, Christopher S. Allen, Yimin A. Wu, Jaco Olivier, Jan Neethling, Nicholas Harrison, Angus I. Kirkland, and Jamie H. Warner, Dynamics of Single Fe Atoms in Graphene Vacancies, Nano Letters vol. 13, 4 (2013) 1468–1475.

Aleksey Shmeliov, Judy S. Kim, Konstantin B. Borisenko, Peng Wang, Eiji Okunishi, Mervyn Shannon, Angus I. Kirkland, Peter D. Nellist, Valeria Nicolosi, h-BN nanosheets: Studying the stacking sequence dependence by ultra-high electron microscopy, Nanoscale vol. 5 (2013) 2290-2294.

Judy S. Kim, Konstantin B. Borisenko, Valeria Nicolosi and Angus I. Kirkland, Controlled Radiation Damage and Edge Structure in Boron Nitride Membranes, ACS Nano, vol. 5, pp. 3977-3986, 2011.

Kim Judy S., LaGrange T., Reed B. W., Knepper, R, Weihs, T.P., Browning, N.D., Campbell, G.H., Direct characterization of phase transformations and morphologies in moving reaction zones in Al/Ni nanolaminates using dynamic transmission electron microscopy , Acta Materialia, vol. 59, pp. 3571-3580, 2011.

Judy S. Kim, T. B. LaGrange, B.W. Reed, M.L. Taheri, M.R. Armstrong, W. E. King, N. D. Browning, G.H. Campbell,Imaging of Transient Structures using Nanosecond in situ TEM, Science, vol. 321, pp. 1472, 2008.

M. R. Armstrong, K. Boyden, N. D. Browning, G. H. Campbell, J. D. Colvin, W. J. DeHope, A. M. Frank, D. J. Gibson, F. Hartemann, Judy S. Kim, W. E. King, T. B. LaGrange, B. J. Pyke, B. W. Reed, R. M. Shuttlesworth, B. C. Stuart, B. R. Torralva, Practical Considerations for High Spatial and Temporal Resolution Dynamic Transmission Electron Microscopy, Ultramicroscopy, vol. 107, pp. 356, 2007.

T. LaGrange, M. R. Armstrong, K. Boyden, C. G. Brown, N. D. Browning, G. H. Campbell, J. D. Colvin, W. J. DeHope, A. M. Frank, D. J. Gibson, F. V. Hartemann, Judy S. Kim, W. E. King, B. J. Pyke, B. W. Reed, M. D. Shirk, R. M. Shuttlesworth, B. C. Stuart, B. R. Torralva, Single Shot Dynamic Transmission Electron Microscopy for Materials Science, Applied Physics Letters, vol. 89, pp. 044105, 2007.

Judy S. Kang (Judy S. Kim), R. A. Gagliano, G. Ghosh, M. E. Fine, Isothermal Solidification of Cu/Sn Diffusion Couples to Form Thin Solder Joints, Journal of Electronic Materials, vol. 31, no. 11, pp. 1238-1243, 2002.