Professor Angus Kirkland

Professor MA, DPhil, MA PhD (Cambridge), FRSC, FInstP, FRMS

Angus Kirkland is professor of materials and leads the image processing and analysis group. His researchinterests include exit wave reconstruction, aberration corrected high resolution imaging, novel electron detectors and methods for phase retrieval. He is also actively involved in the development of new imaging geometries and instrumentation and in remote access to electron microscopes. He is also Fellow of Linacre College.

Contact Details

30.07 Holder Building
Department of Materials, University of Oxford
Parks Road, Oxford, OX1 3PH
Telephone: 01865 273662
Fax: 01865 273789
E-mail: angus.kirkland@materials.ox.ac.uk

 

Publications

Konstantin B. Borisenko, Grigore Moldovan, Angus I. Kirkland, Dirk Van Dyck, Hsin-Yu Tang and Fu-Rong Chen, Toward electron exit wave tomography of amorphous materials at atomic resolution, Journal of Alloys and Compounds, vol. 536S, pp. S94-S98, 2012.

J H Warner, E R Margine, M Mukai, A W Robertson, F Giustino, and Angus I Kirkland, Dislocation-Driven Deformations in Graphene, Science, vol. 337, no. 6091, pp. 209-212, 2012.

Konstantin B. Borisenko, Grigore Moldovan, Angus I. Kirkland, Amy Wang, Dirk Van Dyck and Fu-Rong Chen, Toward 3D structural information from quantitative electron exit wave analysis, Journal of Physics: Conference Series, vol. 371, pp. 012057, 2012.

Aiming Yan, Tao Sun, Konstantin B. Borisenko, D. Bruce Buchholz, Robert P. H. Chang, Angus I. Kirkland and Vinayak P. Dravid, Multi-scale order in amorphous transparent oxide thin films, Journal of Applied Physics, vol. 112, no. 5, pp. 54907, 2012.

Jamie H Warner, Masaki Mukai, and Angus I Kirkland, Atomic Structure of ABC Rhombohedral Stacked Trilayer Graphene, ACS Nano, vol. 6, no. 6, pp. 5680-5686, 2012.

Xiaobin Zhang, Masaki Takeguchi, Ayako Hashimoto, Kazutaka Mitsuishi, Peng Wang, Peter D Nellist, Angus I Kirkland, Meguru Tezuka, and Masayuki Shimojo, Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy, Journal of Electron Microscopy, vol. 61, no. 3, pp. 159-169, 2012.

Peng Wang, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo, Yufang Zhu, Mitsuhiro Okuda, Angus I Kirkland, and Peter D Nellist, Three-dimensional elemental mapping of hollow Fe2O3@SiO2 mesoporous spheres using scanning confocal electron microscopy, Applied Physics Letters, vol. 100, no. 21, pp. 213117, 2012.

Ayako Hashimoto, Peng Wang, Masayuki Shimojo, Kazutaka Mitsuishi, Peter D Nellist, Angus I Kirkland, and Masaki Takeguchi, Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy, Applied Physics Letters, vol. 101, no. 25, pp. 253108, 2012.

Christopher S Allen, Alex W Robertson, Angus I Kirkland, and Jamie H Warner, The Identification of Inner Tube Defects in Double-Wall Carbon Nanotubes, Small, vol. 8, no. 24, pp. 3810-3815, 2012.

Miia Klingstedt, Margareta Sundberg, Lars Eriksson, Sarah Haigh, Angus I Kirkland, Daniel Grüner, Annick De Backer, Sandra Van Aert, and Osamu Terasaki, Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on Sb xWO 3+ y( x?0.11), Zeitschrift für Kristallographie, vol. 227, no. 6, pp. 341-349, 2012.

Hua Jianga,b,?, Janne Ruokolainenb, Neil Youngc, Tetsuo Oikawad, Albert G. Nasibulina, Angus Kirklandc, Esko I. Kauppinena, Performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto University, Micron, vol. 43, no. 4, pp. 545-550, 2012.

Judy S. Kim, Konstantin B. Borisenko, Valeria Nicolosi and Angus I. Kirkland, Controlled Radiation Damage and Edge Structure in Boron Nitride Membranes, ACS Nano, vol. 5, pp. 3977-3986, 2011.

Peng Wang, Gavin Behan, Angus I. Kirkland, Peter D. Nellist, Eireann C. Cosgriff, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi and Masayuki Shimojo, Bright field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope, Ultramicroscopy, vol. 111, pp. 877-886, 2011.

Sarah J Haigh, Neil P Young, Hidetaka Sawada, Kunio Takayanagi, and Angus I Kirkland, Imaging the Active Surfaces of Cerium Dioxide Nanoparticles, ChemPhysChem, vol. 12, no. 13, pp. 2397-2399, 2011.

Jamie H Warner, Simon R Plant, Neil P Young, Kyriakos Porfyrakis, Angus I Kirkland, and G Andrew D Briggs, Atomic Scale Growth Dynamics of Nanocrystals within Carbon Nanotubes, ACS Nano, vol. 5, no. 2, pp. 1410-1417, 2011.

Jamie H Warner, Neil P Young, Angus I Kirkland, and G Andrew D Briggs, Resolving strain in carbon nanotubes at the atomic level, Nature Materials, vol. 10, no. 12, pp. 958-962, 2011.

Yimin A Wu, Angus I Kirkland, Franziska Schäffel, Kyriakos Porfyrakis, Neil P Young, G Andrew D Briggs, and Jamie H Warner, Utilizing boron nitride sheets as thin supports for high resolution imaging of nanocrystals, Nanotechnology, vol. 22, no. 19, pp. 195603, 2011.

Neil P. Young, M.A. van Huis, H.W. Zandbergen, H. Xu, Angus I. Kirkland, Variable Temperature Investigation of the Atomic Structure of Gold Nanoparticles, Proceedings of EMAG 2009, vol. In Press, 2010.

Valeria Nicolosi, Zabeada Aslam, K. Sader, Gareth M. Hughes, D. Vengust, Neil P. Young, Ron Doole, D. Mihailovic, A. L. Bleloch, Angus I. Kirkland,Nicole Grobert and Peter D. Nellist, Self-assembled Hg//MoSI Nanowire complexes: the next generation of molecular scale interconnects, New Journal of Chemistry, vol. 34, pp. 2241-2246, 2010.

Anna-Clare Milazzo, Grigore Moldovan, Jason Lanman, Liang Jin, James C. Bouwer, Stuart Klienfelder, Steven T. Peltier, Mark H. Ellisman, Angus I. Kirkland and Nguyen-Huu Xuonga,Characterization of a direct detection device imaging camera for transmission electron microscopy, Ultramicroscopy, vol. 110, no. 7, pp. 744-747, 2010.

Peng Wang, Gavin Behan, Masaki Takeguchi, Ayako Hashimoto, Kazutaka Mitsuishi, Masayuki Shimojo, Angus I. Kirkland, and Peter D. Nellist, Nano-scale energy filtered scanning confocal electron microscopy (EFSCEM) using a double aberration-corrected transmission electron microscope, Physics Review Letter, vol. 104, no. 200801, 2010.

A.R. Lupini, Peng Wang, Peter D. Nellist, Angus I. Kirkland and S.J. Pennycook, Aberration Measurement using the Ronchigram Contrast Transfer Function, Ultramicroscopy, vol. 110, pp. 891-898, 2010.

Moldovan Grigore, Jeffery B., Nomerotski A. and Kirkland Angus, Direct electron detection for TEM with column parallel CCD, Nucl. Instr. and Meth. A, vol. doi:10.1016/j.nima.2009.01.038, 2009.

Moldovan Grigore, Jeffery B., Nomerotski A. and Kirkland Angus, Imaging modes for direct electron detection in TEM with Column Parallel CCD, Nucl. Instr. and Meth. A, vol. doi: 10.1016/j.nima.2009.03.105, 2009.

Sarah Haigh, L P Stoter, H. Sawada and Angus I. Kirkland, , Aberration Corrected Transmission Electron Microscopy and the Characterisation of Nanomaterials, , NanoAfrica 2009, CSIR International Conference Centre, Pretoria, South Africa, 2009.

Haigh, Sarah. and Kirkland, Angus I., Finding Phase information from the darkness,, Electron Microscopy and Analysis Group Conference, vol. in submission, 2009.

Angus I Kirkland, L.Y.Chang, Sarah Haigh, C.Hetherington, Transmission Electron Microscopy without Aberrations: Applications to Materials Science., Current Applied Physics, vol. 8, pp. 425-428, 2009.

J.Watt, Neil Young, Sarah J. Haigh, Angus I. Kirkland and R.D.Tilley, Synthesis and Structural Characterization of Branched Palladium Nanostructures, Advanced Materials, vol. 21, no. 22, pp. 2288-2292, 2009.

Sarah J Haigh, H.Sawada, Angus I Kirkland, Optimal Conditions for Aberration Corrected Super Resolution Exit Wavefunction Reconstruction, Philosophical Transactions of the Royal Society, A Mathematical, Physical and Engineering Sciences, vol. 367, no. 1903, pp. 3755-3771, 2009.

Haigh, Sarah J. and Sawada, Hidetaka and Kirkland, Angus I., Atomic Structure Imaging Beyond Conventional Resolution Limits in the Transmission Electron Microscope, Physical Review Letters, vol. 103, no. 12, pp. 126101-126104, 2009.

Sarah J Haigh, H.Sawada, Angus I Kirkland,, Exceeding Conventional Resolution Limits in High Resolution Transmission Electron Microscopy Using Tilted Illumination and Exit Wave Restoration,, Microscopy and Microanalysis, no. in submission, 2009.

Sarah J. Haigh, Angus I. Kirkland & L.Y.Chang. , Aberration Corrected Tilt Series Reconstruction, Proceedings of 16th International Microscopy Congress, Sapporo H.Ichinose & T.Sasaki, (Eds.) , pp. 943, 2009.

Neil P. Young, M.A. van Huis, H.W. Zandbergen, H. Xu, Angus I. Kirkland, Structural and Surface Transformations of Gold Nanoparticles Investigated via Variable Temperature High-Resolution Transmission Electron Microscopy, Ultramicroscopy, vol. doi:10.1016/j.ultramic.2009.12.010, 2009.

Neil P. Young, S.J. Haigh, M.A. van Huis, H.W. Zandbergen and Angus I. Kirkland, Probing Nanoparticle Structure with Aberration-Corrected In-situ Electron Microscopy, Proceedings of the 47th Conference of the Microscopy Society of Southern Africa, no. 47, pp. 50, 2009.

M.A. van Huis, Neil P. Young, G. Pandraud, J.F. Creemer, D. Vanmaekelbergh, Angus I. Kirkland, H.W.Zandbergen, , Atomic Imaging of Phase Transitions and Morphology Transformations in Nanocrystals, Advanced Materials , vol. 21, no. 48, pp. 4992-4995, 2009.

A.S. Barnard, Neil P. Young, Angus I. Kirkland, M.A. van Huis, H. Xu,, Nanogold: A Quantitative Phase Map, ACS NANO, vol. 3, no. 6, pp. 1431-1436, 2009.

Peng Wang, G Behan, Angus I Kirkland, and Peter D Nellist, Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope, Microsc. Microanal., vol. 15, pp. 42-43, 2009.

John Matheson, Grigore Moldovan, A. Clark, M. Prydderch, R. Turchetta, G. Derbyshire, Angus Kirkland and Nigel Allinson, Characterisation of a monolithic active pixel sensor for electron detection in the energy range 10–20 keV, Nuclear Instruments and Methods in Physics Research Section A, vol. 608, no. 1, pp. 199-205, 2009.

Grigore Moldovan and Angus I Kirkland, Imaging electron detectors for low-voltage TEM, Inst. Phys. Conf. Ser. Proc. (EMAG), 2009.

Peng Wang, Gavin Behan, Angus I. Kirkland, and Peter D. Nellist, Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope, Microscopy and Microanalysis (M&M), vol. 15, pp. 42-43, 2009.

Peng Wang, Gavin Behan, Angus I Kirkland and Peter D Nellist, Experimental Setup for Energy-Filtered Scanning Confocal Electron Microscopy (EFSCEM) in a Double Aberration- Corrected Transmission Electron Microscope, Journal of Physics: Conference Series (EMAG), 2009.

Peter D Nellist, Eireann C Cosgriff, Gavin Behan and Angus I Kirkland, Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope, Microscopy and Microanalysis, vol. 14, pp. 82-88, 2008.

Crispin Hetherington, Shery L Y Chang, Sarah Haigh, Peter D Nellist, L. C. Gontard, R. E. Dunin-Borkowski and Angus I Kirkland, High resolution TEM and the application of direct and indirect aberration correction, Microscopy and Microanalysis, vol. 14, pp. 60-67, 2008.

S. Y. Hong, G. Tobias, B. Ballesteros, F. El Oualid, J. C. Errey, K. J. Doores, Angus I Kirkland, Peter D Nellist, L. H. Malcolm and B. G. Davis , Atomic-scale detection of organic molecules coupled to single-walled carbon nanotubes , J. Am. Chem. Soc., vol. 129, pp. 10966-10967, 2008.

Eireann C Cosgriff, A J D'Alfonso, L J Allen, S D Findlay, Angus I Kirkland and Peter D Nellist,Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy, Journal of Physics: Conference Series, vol. 126, pp. 012036, 2008.

A J D'Alfonso, Eireann C Cosgriff, S D Findlay, Angus I Kirkland, Peter D Nellist, M P Oxley, L J Allen, Depth sectioning using electron energy loss spectroscopy, Journal of Physics: Conference Series, vol. 126, pp. 012037, 2008.

Moldovan Grigore, Li Xiaobing, Wilshaw P and Kirkland Angus, Counting Electrons in Transmission Electron Microscopes, Microsc. Microanal. Proc., 2008.

Moldovan Grigore, Li Xiaobing, Wilshaw P and Kirkland Angus, Direct electron detectors for TEM, European Microscopy Congress Proceedings, 2008.

Moldovan Grigore, Li Xiaobing, Wilshaw P and Kirkland Angus, Thin silicon strip devices for direct electron detection in transmission electron microscopy, Nuclear Instruments and Methods in Physics Research A, vol. 591, pp. 134-137, 2008.

Moldovan Grigore, Matheson J, Derbyshire G and Kirkland Angus, Characterisation of a detector based on microchannel plates for electrons in the energy range 10-20keV, Nuclear Instruments and Methods in Physics Research A, vol. doi:10.1016/j.nima.2008.08.057, 2008.

A.J. D'Alfonso, Eireann C Cosgriff, S.D. Findlay, Gavin Behan, Angus I Kirkland, Peter D Nellist, L.J. Allen, Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scattering , Ultramicroscopy, vol. 108, pp. 1567-1578, 2008.

Eireann C Cosgriff, A.J. D'Alfonso, L.J. Allen, S.D. Findlay, Angus I Kirkland, Peter D Nellist,Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part I: Elastic scattering, Ultramicroscopy, vol. 108, pp. 1558-1566, 2008.

L.J Allen, A. J. D'Alfonso, S.D. Findlay, M.P. Oxley, M. Bosman, V.J. Keast, Eireann C Cosgriff, Gavin Behan, Peter D Nellist and Angus I Kirkland, Theoretical Interpretation of Electron Energy-Loss Spectroscopic Images, Proceedings of the EMMM-2007 International Conference, pp. 32-46, 2008.

Angus I Kirkland, P.D.Nellist, L-Y Chang, Sarah J. Haigh, Chapter 8: Aberration Corrected Imaging in Conventional Transmission Electron Microscopy, Advances in Imaging and Electron Physics, no. 153, pp. 283-325, 2008.

Sarah J. Haigh, L.Y. Chang, H.Sawada, Neil P.Young, Angus I. Kirkland, New Considerations for exit wavefunction restoration under aberration corrected conditions., Proceeding of the 14th European Microscopy Congress, Aachen., no. 1, pp. 765, 2008.

Sarah J. Haigh, Angus I Kirkland and L.Y.Chang, Aberration Corrected Tilt Series Restoration, Journal of Physics Conference Series, vol. 126, pp. 12042-12046, 2008.

Angus I. Kirkland, Sarah J.Haigh and L.Y.Chang, Aberration corrected TEM: Current Status and Future Prospects, Journal of Physics: Conference Series, vol. 126, pp. 12034-12040, 2008.

Rahman, Mustafizur., Kirkland, Angus., Cockayne, David., Meyer, R., Oxford CyberSEM: Remote Microscopy, EMAG 2007, Glasgow, UK, 2007.

Moldovan Grigore, Li Xiaobing, Wilshaw P and Kirkland Angus, Can direct electron detectors outperform phosphor-CCD systems for TEM?, Inst. Phys. Conf. Ser. Proc. (EMAG), 2007.

Sarah J Haigh, Angus I. Kirkland and L.Y.Chang, Aberration Corrected Tilt Series Reconstruction, Microscopy and Microanalysis, vol. 13, no. 2, pp. 876, 2007.

Angus I Kirkland, Sarah Haigh and J.Sloan, Ultrahigh resolution Imaging of Local Structural Distortions in Intergrowth Tungsten Bronzes, Ultramicroscopy, vol. 107, pp. 501, 2007.

Angus I. Kirkland, L.Y.Chang, Sarah J. Haigh, and C.J.D.Hetherington, Imaging and Exit Wave Reconstruction in an Aberration-Free Environment, 11th Meeting on Frontiers of Electron Microscopy in Materials Science, 2007.

Peter D Nellist, Gavin Behan, Angus I Kirkland and Crispin Hetherington, Confocal operation of a transmission electron microscope with two aberration correctors, Appl. Phys. Lett., vol. 89, no. 124105, 2006.

G. R. Lovely, A. P. Brown, R. Brydson, Angus I. Kirkland, R. Meyer, Shery L.Y. Chang, M. Falke, A. Bleloch, and D. Jefferson, HREM of the 111 Surfaces of Iron Oxide Nanoparticles, Micron, vol. in press, 2006.

G. R. Lovely, A. P. Brown, R. Brydson, Angus I. Kirkland, R. Meyer, Shery L.Y. Chang, M. Falke, A. Bleloch, and D. Jefferson, Observation of octahedral cation coordination on the 111 Surfaces of Iron Oxide Nanoparticles, Appl. Phys. Lett., vol. 88, pp. 93124, 2006.

Angus I. Kirkland, R. R. Meyer and Shery L. Y. Chang, Measuring and Compensating Aberrations for HRTEM, Microscopy and Microanalysis, vol. in press, 2006.

Shery L. Y. Chang and Angus I. Kirkland, Comparisons of Linear and Nonlinear Image Restoration, Microscopy and Microanalysis, vol. in press, 2006.

Shery L.Y. Chang, Angus I. Kirkland and J. Titchmarsh , On the Importance of C5 for a C3 and Cc-Corrected Electron Microscope, Ultramicroscopy, vol. 106, pp. 301-306, 2006.

G. R. Lovely, A. P. Brown, R. Brydson, Angus I. Kirkland, R. Meyer, M. Salke, A. Bleloch, D. Jefferson, and Shery L. Y. Chang, HREM of the 111 Surfaces of Ion Oxide Nanoparticles, Journal of Physics, vol. 26, pp. 191, 2006.

Sarah J. Haigh, Shery L. Y. Chang, Angus I. Kirkland, and A. Hashimoto, Optical Imaging Conditions for Transmission Electron Microscopy of Endohedral Peapod Structures, Journal of Physics, vol. 26, pp. 374, 2006.

M. Doblinger, G.B. Winkelman, Christian Dwyer, C. Marsh, Angus I. Kirkland, David J.H. Cockayne, M.J. Hoffmann , Structural and compositional comparison of Si3N4 ceramics with different fracture modes, Acta Mater, vol. 54, no. 7, pp. 1949-1956, 2006.

Helen L Marsh, D S Deak, F Silly, Angus I Kirkland and M R Castell, Hot STM of nanostructure dynamics on SrTiO3(001), Nanotechnology, vol. 17, pp. 3543-3548, 2006.

Kirkland, Angus I. and Chang, Shery L.Y., An assessment of imaging models for exit wave restoration, Microscopy And Microanalysis, vol. 11, pp. 2152, 2005.

Chang, Shery L.Y., Meyer, R.R. and Kirkland, Angus I., Calculations of HREM image intensity using Monte Carlo integration, Ultramicroscopy, vol. 104, no. 03-Apr, pp. 271-280, 2005.

Dunin-Borkowski, R.E., Kasama, T., Cervera, L., Twitchett, A.C., Midgley, P.A., Robins, A.C., Smith, D.W., Gronsky, J.J., Thomas, C.M., Fischione, P.E., Hetherington, C.J.D. and Kirkland, Angus I., Aberration correction: some advantages and alternatives, Microscopy And Microanalysis, vol. 10, pp. 22, 2005.

Hutchison, J.L., Titchmarsh, J.M., Cockayne, David J.H., Doole, R.C., Hetherington, C.J.D., Kirkland, Angus I. and Sawada, H., A versatile double aberration-corrected, energy filtered HREM/STEM for materials science, Ultramicroscopy, vol. 103, no. 1, pp. 7-15, 2005.

Hutchison, J.L., Titchmarsh, J.M., Cockayne, David J.H., Hetherington, C.J.D., Kirkland, Angus I., Doole, R.C. and Sawada, H., A new double-corrected HREM/STEM and its applications for advanced materials, Microscopy And Microanalysis, vol. 10, pp. 8, 2005.

Sawada, H., Tomita, T., Naruse, M., Honda, T., Hambridge, P., Hartel, P., Haider, M., Hetherington, C., Doole, R., Kirkland Angus, Hutchison, J., Titchmarsh, J. and Cockayne, David.,Experimental evaluation of a spherical aberration-corrected TEM and STEM, Journal Of Electron Microscopy, vol. 54, no. 2, pp. 119-121, 2005.

Sloan, J., Kirkland, Angus I., Carter, R., Meyer, R.R., Vlandas, A. and Hutchison, J.L., Image restoration of one-dimensional HgTe crystals formed within walled carbon nanotubes, Microscopy And Microanalysis, vol. 11, pp. 198, 2005.

Hutchison, J.L., Allsop, N., Kirkland, Angus I., Hetherington, C.J.D., Titchmarsh, J.M., Cockayne, David J.H. and Dobson, P.J., Optimisd HREM imaging of CdSe nanoparticles, Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium, vol. 2, pp. 93, 2004.

Angus I.Kirkland, R.R.Meyer, David J.H Cockayne, Crispin J.D.Hetherington, J.L.Hutchison and J.M.Titchmarsh, Exit wave reconstruction using an energy filtered aberration corrected TEM, Proceedings of the 13th European Microscopy Congress, vol. 1, pp. 49, 2004.

Sawada, H., Tomita, T., Kaneyama, T., Hosokawa, F., Naruse, M., Honda, T., Hartel, P., Haider, M., Tanaka, N., Hetherington, Crispin J.D., Doole, R.C., Kirkland, Angus I., Hutchison, J.L., Titchmarsh, J.M. and Cockayne, David J.H, Cs corrector for illumination, Microscopy and Microanalysis, vol. 10, pp. 976, 2004.

Carter, R., Sloan, J., Kirkland, Angus I., Meyer, R.R., Hutchison, J.L. and Green, M.L.H., A one-dimensional semiconductor crystal with differentially rotating atomic layers formed within a single-walled carbon nanotube, Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium, vol. 2, pp. 351, 2004.

Doblinger, M., Cockayne, David J.H., Meyer, R.R., Kirkland, Angus I. and Nguyen-Manh, D.,Induced order in intergranular films in Si3N4 ceramics, Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium, vol. 2, pp. 59, 2004.

Friedrichs, S., Kirkland, Angus I. and Green, M.L.H., Combined characterisation of the structural and physical properties of single walled cardbon nanotube composites., Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium, vol. 2, pp. 317, 2004.

Hsieh, W.K., Chen, F.R., Kai, J.J. and Kirkland, Angus I., Resolution extension and exit wave reconstruction in complex HREM, Ultramicroscopy, vol. 98, no. 02-Apr, pp. 99-114, 2004.

Hutchison, J.L., Kirkland, Angus I., Sloan, J. and Green, M.L.H., Growing 1D crystals inside carbon nanotubes: new nanostructures from old materials, Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium, vol. 2, pp. 93, 2004.

Hutchison, J.L., Sloan, J., Kirkland, Angus I., Green, M.L.H. and Green, M.L.H., Growing and characterizing one-dimensional crystals within single-walled carbon nanotubes, Journal Of Electron Microscopy, vol. 53, no. 2, pp. 101-106, 2004.

Kirkland, Angus I. and Meyer, R.R., Indirect transmission electron microscopy Aberration measurement and compensation and exit wave reconstruction, Electron Microscopy And Analysis, pp. 331-336, 2004.

Kirkland, Angus I. and Meyer, R.R., Indirect high-resolution transmission electron microscopy Aberration measurement and wavefunction reconstruction, Microscopy And Microanalysis, vol. 10, no. 4, pp. 401-413, 2004.

Kirkland, Angus I., Titchmarsh, J.M., Hutchison, J.L., Cockayne, David J.H., Hetherington, C.J.D., Doole, R.C., Sawada, H., Haider, M. and Hartel, P., A double aberration corrected, energy filtered HREM/STEM, Jeol News, vol. 39, no. 1, pp. 1-5, 2004.

Meyer, R.R. and Kirkland, Angus I., Automated Object Wave Restoration from Combined Tilt Focus Series, APEM, Japan Society for Microscopy, 2004.

Meyer, R.R., Kirkland, Angus I. and Saxton, W.O., A new method for the determination of the wave aberration function for high-resolution TEM. Measurement of the antisymmetric aberrations, Ultramicroscopy, vol. 99, no. 02-Mar, pp. 115-123, 2004.

Sawada, H., Tomita, T., Naruse, M., Honda, T., Hartel, P., Haider, M., Hetherington, C.J.D., Doole, R.C., Kirkland, Angus I., Hutchison, J.L., Titchmarsh, J.M. and Cockayne, David J.H.,200kV TEM with Cs correctors for illumination and imaging, APEM, Japan Society for Microscopy, 2004.

Sloan, J., Carter, R., Philp, E., Kirkland, Angus I., Meyer, R.R., Hutchison, J.L. and Green, M.L.H.,Super-resolved imaging of twisted 1D crystals formed within single walled carbon nanotubes, Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium, vol. 2, pp. 321, 2004.

Sloan, J., Kirkland, Angus I., Hutchison, J.L., Friedrichs, S. and Green, M.L.H., Synthesis and Structural Characterisation of Single Wall Carbon Nanotubes Filled with Ionic and Covalent Materials, Molecular Nanowires and other Quantum Objects, pp. 77-88, 2004.

Sloan, J., Luzzi, D.E., Kirkland, Angus I., Hutchison, J.L. and Green, M.L.H., Imaging and characterization of molecules and one-dimensional crystals formed within carbon nanotubes., MRS Bulletin, vol. 29, no. 4, pp. 265-271, 2004.

Thamavaranukup, N., Hoppe, H.A., Ruiz-Gonzalez, L., Costa, P., Sloan, J., Kirkland, Angus and Green, M.L.H., Single-walled carbon nanotubes filled with M OH (M = K, Cs) and then washed and refilled with clusters and molecules, Chemical Communications, vol. 15, pp. 1686-1687, 2004.

Vlandas, A., Carter, R., Sorsa, S., Flahaut, E., Sloan, J., Kirkland, Angus I., Hutchison, J.L. and Green, M.L.H., Encapsulation of semiconductors in double wall carbon nanotubes, Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium, vol. 2, pp. 345, 2004.

Friedrichs, S., Sloan, J., Meyer, R.R., Kirkland, Angus I., Hutchison, J.L. and Green, M.L.H.,Characterisation of LaI2@(18 3)SWNT Encapsulation Composite - A 1D LaI2 Crystal fragment adopting the reduced structrue of LaI3, Microscopy And Microanalysis, vol. 9, pp. 324, 2004.

Hsieh, W.K., Chen, F.R., Kai, J.J. and Kirkland, Angus I., Resolution extrnsion and exit wave reconstruction in complex HREM, APEM, Japan Society for Microscopy, 2003.

Alexandrou I., Sano N., Burrows A., Meyer R.R., Wang H., Kirkland Angus I., Kiely C.J. and Amaratunga G.A.J., Structural investigation of MoSi2 core-shell nano-particles pormed by arc discharge in water, Nanotechnology, vol. 14, pp. 913, 2003.

Meyer R.R. and Kirkland Angus I., Characterisation of the signal and noise transfer of CCD cameras for electron detection, SPIE Press, pp. 184-196, 2003.

Sayagues M., Titmuss K., Meyer R., Kirkland Angus, Sloan J., Hutchison J. and Tilley R.,Structural characterization of the n=5 layered perovskite neodymium titanate using high-resolution transmission electron microscopy and image reconstruction, Acta Crystallographica Section B- Structural Science, vol. 59, pp. 449-455, 2003.

Chang, Shery L.Y., Chen, F.R., Kirkland, Angus I. and Kai, J.J., Calculations of spherical aberration-corrected imaging behaviour, Journal Of Electron Microscopy, vol. 52, no. 4, pp. 359-364, 2003.

Chang, Shery L.Y., Meyer, R.R. and Kirkland, Angus I., Calculations of limited coherence for high resolution electron microscopy, Electron Microscopy And Analysis, pp. 345-348, 2003.

Chang, Shery L.Y., Meyer, R.R. and Kirkland, Angus I., Models of coherence for High Resolution Electron Microscopy. Proceedings of the 13th Electron Microscopy ConferenceAntwerp, Belgium, 2, no. 435, 2003.

Chang, Shery L.Y.,Chen, F.R., and Kirkland, Angus I., Calculations of spherical aberration-corrected imaging behaviour, Journal Of Electron Microscopy, vol. 52, pp. 359, 2003.

Friedrichs, S., Philp, E., Meyer, R.R., Sloan, J., Kirkland, Angus I., Hutchison, J.L. and Green, M.L.H., LaI2@(18,3)SWNT the crystallisation behaviour of a LaI2 fragment, confined within a single-walled carbon nanotube, Electron Microscopy And Analysis, pp. 455-458, 2003.

Hsieh, W.K., Chen, F.R., Kai, J.J. and Kirkland, Angus I., Resolution extension and exit wave reconstruction in complex HREM, APEM, Japan Society for Microscopy, 2003.

Meyer, R.R., Friedrichs, S., Kirkland, Angus I., Sloan, J., Hutchison, J.L. and Green, M.L.H., A composite method for the determination of the chirality of single walled carbon nanotubes, Journal Of Microscopy-Oxford, vol. 212, pp. 152-157, 2003.

Meyer, R.R. and Kirkland, Angus I., Measuring isoplanaticity in high-resolution electron microscopy, Electron Microscopy And Analysis, pp. 199-202, 2003.

Meyer, R.R., Kirkland, Angus I., Dovey, M., Cockayne, David J.H. and Jeffreys, P., Remote microscopy using the grid, Electron Microscopy And Analysis, pp. 173-176, 2003.

Philp, E., Sloan, J., Kirkland, Angus I., Meyer, R.R., Friedrichs, S., Hutchison, J.L. and Green, M.L.H., An encapsulated helical one-dimensional cobalt iodide nanostructure, Nature Materials, vol. 2, no. 12, pp. 788-791, 2003.

Sloan, J., Kirkland, Angus I., Hutchison, J.L. and Green, M.L.H., Aspects of crystal growth within carbon nanotubes, Comptes Rendus Physique, vol. 4, no. 9, pp. 1063-1074, 2003.

Sloan, J., Kirkland, Angus I., Hutchison, J.L. and Green, M.L.H., Integral Atomic Layer Architectures of 1D Crystals Inserted into Single Walled Carbon Nanotubes, Electron Microscopy of Nanotubes, Wang, Z.L. and Hui, C., Kluwer Press. Ch 12, pp. 273-300, 2003.

Sloan, J., Langley, K.L., Day, E.V., Meyer, R.R. and Kirkland, Angus I., Studies of variations in insertion cations in Intergrowth Tungsten Bronzes (ITBs), Electron Microscopy And Analysis, pp. 71-74, 2003.

Sloan, J., Langley, K.L., Kirkland, Angus I., Meyer, R.R., Sayagues, M.J., Tilley, R.J.D. and Hutchison, J.L., Structural studies of a modulated quaternary layered perovskite., Electron Microscopy And Analysis, pp. 229-232, 2003.

Titchmarsh, J.M., Cockayne, David J.H., Doole, R.C., Hetherington, C.J.D., Hutchison, J.L., Kirkland, Angus I. and Sawada, H., A versatile double aberration-corrected, energy filtered HREM/STEM for materials science, Proceedings of the 13th Electron Microscopy Conference. Antwerp, Belgium, vol. 2, pp. 27, 2003.

Kirkland Angus I. and Sloan J., Direct and indirect electron microscopy of encapsulated nanocrystals, Topics in Catalysis, vol. 21, pp. 139-154, 2002.

Sloan J., Kirkland Angus I., Hutchison J.L. and Green M.L.H., Structural characterization of atomically regulated nanocrystals formed within single-walled carbon nanotubes using electron microscopy, Accounts of Chemical Research, vol. 35, pp. 1054-1062, 2002.

Shery L. Y. Chang, R. R. Meyer and Angus I. Kirkland, An Assessment of Image Simulation Methods for Exit Wave Restoration, Proceedings of the 15th International Congress on Electron Microscopy, 2002.