Dr Hidetaka Sawada

BEng, MEng, PhD (The University of Tokyo)

Hidetaka Sawada completed his PhD in the department of materials at the University of Tokyo in 2002.  Hidetaka Sawada had worked in the technical and development division of electron microscope of JEOL Ltd. from 2002 to 2015.

Hidetaka Sawada is a manager of European EM product support in JEOL UK Ltd., and an academic visitor of University of Oxford (Materials) from 2015.

Contact Details

30.10 Holder Building
Department of Materials, University of Oxford
Parks Road, Oxford, OX1 3PH
Telephone: 01865 273707
E-mail: hide.sawada@materials.ox.ac.uk
 
 

Publications

H. Sawada, T. Sasaki, F. Hosokawa, K. Suenaga, Atomic-resolution STEM imaging of graphene at low voltage of 30 kV with resolution enhancement by using large convergence angle. Physical Review Letters 114 (2015) 166102.

H. Sawada, N. Shimura, F. Hosokawa, N. Shibata, Y. Ikuhara, Resolving 45-pm-separated Si-Si atomic columns with aberration corrected STEM. Microscopy 64 (2015) 213-217.

H. Sawada, T. Sasaki, F. Hosokawa, K. Suenaga, Resolution enhancement at a large convergence angle by a delta corrector with a CFEG in a low-accelerating-voltage STEM. Micron, 63 (2014) 35–39.

H. SawadaAberration Correction in STEM, Ronghigram and Geometrical aberration. Scanning Transmission Electron Microscopy of Nanomaterials [Edited by: Nobuo Tanaka] (2014) 283-306, 461-486.

H. Sawada, M. Watanabe, I. Chiyo, Ad hoc auto-tuning of aberrations using high-resolution STEM images by autocorrelation function. Microsc. Microanal. 18 (2012) 705-710.

H. Sawada, F. Hosokawa, T. Sasaki, T. Kaneyama, Y. Kondo K. Suenaga, Aberration correctors developed under the Triple C project. Advances in Imaging and Electron Physics (Edited by P. W. Hawkes) 168 (2011) 297-336.

H. Sawada, T. Sasaki, F. Hosokawa, S. Yuasa, M. Terao, M. Kawazoe, T. Nakamichi, T. Kaneyama, Y. Kondo, K. Kimoto, K. Suenaga, Higher-order aberration corrector for an image-forming system in a transmission electron microscope. Ultramicroscopy 110 (2010) 958-961.

H. Sawada, T. Sasaki, F. Hosokawa, S.Yuasa, M. Terao, M. Kawazoe, T. Nakamichi, T. Kaneyama, Y. Kondo, K. Kimoto, K. Suenaga, Correction of higher order geometrical aberration by triple 3-fold astigmatism field. J. Electron Microsc. 58 (2009) 34-347.

H. Sawada, Y. Tanishiro, N. Ohashi, T. Tomita, F. Hosokawa, T. Kaneyama, Y. Kondo, K. Takayanagi, STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun. J. Electron Microsc. 58 (2009) 357-361.

H. Sawada, T. Sannomiya, F. Hosokawa, T. Nakamichi, T. Kaneyama, T. Tomita, Y. Kondo, T. Tanaka, Y. Oshima, Y. Tanishiro, K. Takayanagi, Measurement method of aberration from Ronchigram by autocorrelation function. Ultramicroscopy 108 (2008) 1467-1475.

H. Sawada, F. Hosokawa, T. Kaneyama, T. Ishizawa, M. Terao, M. Kawazoe, T. Sannomiya, T. Tomita, Y. Kondo, T. Tanaka, Y. Oshima, Y. Tanishiro, N. Yamamoto, K. Takayanagi, Achieving 63 pm resolution in scanning transmission electron microscope with spherical aberration corrector. Jpn. J. Appl. Phys. 46 (2007) L568-570.

H. Sawada, H. Ichinose, M. Kohyama. Gap states due to stretched bonds at (112) Σ3 boundary in diamond. J. Phys. Condens. Matter 19 (2007) 026223-9.

H. Sawada, T. Tomita, M. Naruse, T. Honda, P Hambridge, P. Hartel, M. Haider, C. J. D. Hetherington, R. C. Doole, A. I. Kirkland, J. L. Hutchison, J. M. Titchmarsh, D. J. H. Cockayne, Experimental evaluation of a spherical aberration-corrected TEM and STEM. J. Electron Microsc. 54 (2005) 123-126.

H. Sawada, H. Ichinose, Atomic structure of fivefold twin center in diamond film. Diamond and Related Materials 14 (2005) 109-112.

H. Sawada, H. Ichinose, M. Kohyama, Atomic structure of the Σ3 and Σ9 grain boundaries in CVD diamond film. Scripta Materialia, 51 (2004) 689-692.

H. Sawada, H. Ichinose, M. Kohyama, Imaging of a single atomic column in silicon grain boundary. J. Electron Microsc. 51 (2002) 353-357.

H. Sawada, H. Ichinose, Structure of 112 Σ3 boundary in silicon and diamond. Scripta Materialia 44 (2001) 2327-2330.

H. Sawada, H. Ichinose, H. Watanabe, D. Takeuchi, H. Okushi, Cross-sectional TEM study of unepitaxial crystallites in a homoepitaxial diamond film. Diamond and Related Materials, 10 (2001) 2030-2034.

H. Sawada, H. Ichinose, H. Watanabe, D. Takeuchi, H. Okushi. Structure of unepitaxial crystallites in a homoepitaxial diamond film. Diamond and Related Materials, 10 (2001) 2096-2098.

 

 L. Tizei, Y. Lin, M. Mukai, H. Sawada, A. Lu, L. Li, K. Kimoto, K. Suenaga, Exciton Mapping at Subwavelength Scales in Two-Dimensional Materials. Physical Review Letters 114 (2015) 107601.

 T. Sasaki, H. Sawada, F. Hosokawa, Y. Sato, K. Suenaga, Aberration-corrected STEM/TEM imaging at 15kV. Ultramicroscopy 145 (2014)50-55.

 A. J. D'Alfonso, A. J. Morgan, A. W. C. Yan, P. Wang, H. Sawada, A. I. Kirkland, L. J. Allen, Deterministic electron ptychography at atomic resolution. Phys. Rev. B 89 (2014) 064101.

 T Kaneko, A Saitow, T Fujino, E Okunishi, H SawadaDevelopment of a high-efficiency DF-STEM detector. Journal of Physics Conference Series 522 (2014) 012050.

 T. Tanaka, A. Sumiya, H. Sawada, Y. Kondo, K. Takayanagi, Direct observation of interstitial titanium ions in TiO2 substrate with gold nanoparticle. Surface Science 619 (2014) 39–43.

 M. Mukai, J. S Kim, K. Omoto, H. Sawada, A. Kimura, A. Ikeda, J. Zhou, T. Kaneyama, N. P. Young, J. H. Warner, P. D Nellist, A. I. Kirkland, The Development of a 200 kV Monochromated Field Emission Electron Source. Ultramicroscopy 140 (2014) 37-43.

 Y. Rozita, R. Brydson, T. P. Comyn, A. J. Scott, C. Hammond, A. Brown, S. Chauruka, A. Hassanpour, N. P. Young, A. I. Kirkland, H. Sawada, R. I. Smith, A Study of Commercial Nanoparticulate γ-Al2O3 Catalyst Supports. ChemCatChem 5 (2013) 2695-2706.

 K. Kimoto, H. Sawada, T. Sasaki, Y. Sato, T. Nagai, M. Ohwada, K. Suenaga, K. Ishizuka, Quantitative evaluation of temporal partial coherence using 3D Fourier transforms of through-focus TEM images. Ultramicroscopy 134 (2013) 86–93.

 T. Sannomiya, H. Sawada, T. Nakamichi, F. Hosokawa, Y. Nakamura, Y. Tanishiro, K. Takayanagi, Determination of aberration center of Ronchigram for automated aberration correctors in scanning transmission electron microscopy. Ultramicroscopy 135 (2013) 71-79.

A. J. Morgan, A. J. D’Alfonso, P. Wang, H. Sawada, A. I. Kirkland, L. J. Allen, Fast deterministic single-exposure coherent diffractive imaging at sub-Ångström resolution. Physical review. B 87 Condensed matter (2013) 094115.

 T. Harumoto, T. Sannomiya, Y. Matsukawa, S. Muraishi, J. Shi, Y. Nakamura, H. Sawada, T. Tanaka, Y. Tanishiro, K. Takayanagi, Controlled polarity of sputter-deposited aluminum nitride on metals observed by aberration corrected scanning transmission electron microscopy. Journal of Applied Physics 113 (2013) 084306.

 F. Hosokawa, H. Sawada, Y. Kondo, K. Takayanagi, K. Suenaga, Development of Cs and Cc correctors for transmission electron microscopy. J. Electron Microsc. 62 (2013) 23-41.

 T. Sasaki, H. Sawada, E. Okunishi, F. Hosokawa, T. Kaneyama, Y. Kondo, K. Kimoto, K. Suenaga, Evaluation of probe size in STEM imaging at 30 and 60 kV. Micron 43 (2012) 551-556.

M. Mitome, H. Sawada, Y. Kondo, Y. Tanishiro, K. Takayanagi, Element discrimination in a hexagonal boron nitride nanosheet by aberration corrected transmission electron microscopy. Ultramicroscopy 112 (2012) 6-11.

 N. Shibata, S. D. Findlay, Y. Kohno, H. Sawada, Y. Kondo, Y. Ikuhara, Differential phase-contrast microscopy at atomic resolution. Nature Physics 8 (2012) 611-615.

 N. P. Young, S. J. Haigh, H. Sawada, K. Takayanagi, A. I. Kirkland, Direct Measurement of the Crystallographically Sensitive Atomic Termination of Nanophase Cerium Dioxide. Journal of Physics Conference Series 371 (2012) 2011.

 T. Sasaki, H. Sawada, E. Okunishi, F. Hosokawa, T. Kaneyama, Y. Kondo, K. Kimoto, K. Suenaga, Evaluation of probe size in STEM imaging at 30 and 60kV. Micron 43 (2011) 551-556.

 E. Okunishi, H. Sawada, Y. Kondo, Experimental study of annular bright field (ABF) imaging using aberration-corrected scanning transmission electron microscopy. Micron 43 (2011) 538-544.

 S. J. Haigh, N. P. Young, H. Sawada, K. Takayanagi, A. I. Kirkland, Imaging the Active Surfaces of Cerium Dioxide Nanoparticles. ChemPhysChem 12 (2011) 2397-9.

 S. Lee, Y. Oshima, H. Sawada, F. Hosokawa, E. Okunishi, T. Kaneyama, Y. Kondo, S. Niitaka, H. Takagi, Y. Tanishiro, K. Takayanagi, Counting lithium ions in the diffusion channel of an LiV2O4 crystal. Journal of Applied Physics 109 (2011) 113530.

 R. Ishikawa, E. Okunishi, H. Sawada, Y. Kondo, F. Hosokawa, E. Abe, Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy. Nature Material 10 (2011) 278-281.

 S. Kim, Y. Oshima, H. Sawada, T. Kaneyama, Y. Kondo, M. Takeguchi, Y. Nakayama, Y. Tanishiro, K. Takayanagi, Quantitative Annular Dark Field STEM Image of Silicon Crystal using a Large Convergent Electron Probe with a 300-kV Cold Field Emission Gun. J. Electron Microsc. 60 (2011)109-116.

 K. Takayanagi, S. Kim, S. Lee, Y. Oshima, T. Tanaka, Y. Tanishiro, H. Sawada, F. Hosokawa, T. Tomita, T. Kaneyama, Y. Kondo,Electron microscopy at a sub-50 pm resolution. J. Electron Microsc. 60 (2011) S239-S244.

 T. Sasaki, H. Sawada, F. Hosokawa, Y. Kohno, T. Tomita, T. Kaneyama, Y. Kondo, K. Kimoto, Y. Sato, K. Suenaga, Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun. J. Electron Microsc. 59, (2010) S7–S13.

 T. Tanaka, K. Sano, M. Ando, A. Sumiya, H. Sawada, F. Hosokawa, E. Okunishi, Y. Kondo, K. Takayanagi, Oxygen-rich Ti1−xO2 pillar growth at a gold nanoparticle–TiO2 contact by O2 exposure. Surface Science 604 (2010) L75–L78.

 S D Findlay, N Shibata, H Sawada, E Okunishi, Y Kondo, Y Ikuhara, Dynamics of annular bright field imaging in scanning transmission electron microscopy. Ultramicroscopy 110 (2010) 903-923.

 Y.Oshima, H. Sawada, F. Hosokawa, E. Okunishi, T. Kaneyama, Y. Kondo, S. Niitaka, H. Takagi, Y. Tanishiro, K. Takayanagi, Direct imaging of lithium atoms in LiVO by spherical aberration-corrected electron microscopy. J. Electron Microsc. 59 (2010) 457-461.

 N. Shibata, Y. Kohno, S. D. Findlay, H. Sawada, Y. Kondo, Y. Ikuhara New area detector for atomic-resolution scanning transmission electron microscopy. J. Electron Microsc. (2010) 473-4739.

 S. Kim, Y. Oshima, H. Sawada, N. Hashikawa, K. Asayama, T. Kaneyama, Y. Kondo, Y. Tanishiro, K. Takayanagi, A Dopant Cluster in a Highly Antimony Doped Silicon Crystal. Applied Physics Express 3 (2010) 081301.

 K. Suenaga, Y. Sato, Z. Liu, H. Kataura, T. Okazaki, K. Kimoto, H. Sawada, T Sasaki, K. Omoto, T. Tomita, T. Kaneyama, Y. Kondo, Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage. Nat. Chem. 1 (2009) 415–418.

 S. D. Findlay, N. Shibata, H. Sawada, E. Okunishi, Y. Kondo, T. Yamamoto, Y. Ikuhara. Robust atomic resolution imaging of light elements using scanning transmission electron microscopy. Applied Physics Letters 95 (2009) 191913.

 S J Haigh, H. Sawada, Angus I Kirkland, Optimal tilt magnitude determination for aberration-corrected super resolution exit wave function reconstruction. Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences 367 (2009) 3755-3771.

 S. J. Haigh, H. Sawada, A. I. Kirkland, Atomic structure imaging beyond conventional resolution limits in the transmission electron microscope. Physical Review Letters 103 (2009) 126101.

J. Yamasaki, H. Sawada, N. Tanaka, First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM. J. Electron Microsc. 54 (2005) 123-1236.

J. L. Hutchison, J. M. Titchmarsh, D. J. H. Cockayne, R. C. Doole, C. J. D. Hetherington, A. I. Kirkland, H SawadaA versatile double aberration-corrected, energy filtered HREM/STEM for materials science. Ultramicroscopy 103 (2005) 7-15.

H. Ichinose, H. Sawada, E. Takuma, M. Osaki, Atomic resolution HVEM and environmental noise. J. Electron Microsc. 48, (1999) 887-89.