Does Contamination Obstruct the Quantitative Interpretation of Restored Exit Waves? S. Bals, L.-Y. Chang, G. van Tendeloo, D. van Dyck, A. I. Kirkland, Ultramicroscopy, 109, 237, 2009

Direct Electron Detection for TEM with Column Parallel CCD, G. Moldovan, B. Jeffery, A. Nomerotskiand A. Kirkland Nuclear Instruments and Methods in Physics Research, A604 108, 2009.

Synthesis and Structural Characterisation of Branched Palladium Nanostructures, J. Watt, N. Young, S. Haigh, A. Kirkland, and R. Tilley, Adv. Mat, 21, 2288, 2009.

Nanogold: A Quantiative Phase Map, A. S. Barnard, N. P. Young A. I. Kirkland, M. A. van Huis and H. Xu, ACS Nano, 3, 1431, 2009.

Characterisation of a Monolithic Active Pixel Sensor for Electron Detection in the Energy Range 10-20keV, J. Matheson, G. Moldovan, A. Clark, M. Prydderch, R. Turchetta, G. Derbyshire, A. I Kirkland and N. Allinson, Nuclear Instruments and Methods in Physics Research,  608(1), 199, 2009

Imaging Modes for Direct Electron Detection in TEM with Column Parallel CCD G. Moldovan, B. Jeffery, A. Nomerotski and A. I. Kirkland, Nuclear Instruments and Methods in Physics Research, A607, 13, 2009

The OptiPuter Microscopy Demonstrator: Enabling Science through a Transatlantic Lightpath, M. Ellisman, T. Hutton, A. Kirkland, A. Lin, C. Lin, T. Molina, S. Peltier, R. Singh, K. Tang, A. E. Trefethen, D. C. H. Wallom, and X. Xiong, Phil. Trans. R. Soc. A367, 2645, 2009.

Optimal Conditions for Super Resolution Exit Wavefunction Reconstruction Using Aberration Corrected Aperture Synthesis, S. Haigh, H. Sawada, A. I. Kirkland, Phil. Trans. Proc. Roy. Soc, A367, 3755, 2009.

Three-Dimensional Imaging by Optical Sectioning in the Aberration-Corrected Scanning Transmission Electron Microscope. G. Behan, E. C. Cosgriff, A. I. Kirkland and P. D. Nellist, Phil. Trans. Proc. Roy. Soc, A367, 1903, 2009.

Exit Wavefunction Reconstruction, A I Kirkland and S J Haigh, JEOL News, 44, 6 2009.

Imaging Atomic Structure Beyond the Axial Information Limit in the Electron Microscope, S. Haigh, H. Sawada, A. I. Kirkland, Phys. Rev. Letts, 103, 126101, 2009.

Direct Atomic Imaging of Nanocrystal Phase and Morphology Transitions at High Temperature, M.A. van Huis, N.P. Young, G. Pandraud, J.F. Creemer, D. Van Maekelbergh, A.I. Kirkland, H.W. Zandbergen, Adv. Mater., 21, 4992, 2009.

Aberration Correction and Exit Wave Reconstruction using Tilt Azimuth Data, A. I. Kirkland, S. J. Haigh, Microscopy and Microanalysis, 15(S2), 1472, 2009.

Real Space Measurements of Bonding Charge Density in Aberration Corrected High Resolution Electron Microscopy, J. Ciston, S. J. Haigh, J. S. Kim, A. I. Kirkland, L. D. Marks, Microscopy and Microanalysis, 15(S2), 1478, 2009.

Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration Corrected Transmission Electron Microscope, P. Wang, G. Behan, A. I. Kirkland, P. D. Nellist, Microscopy and Microanalysis, 15(S2), 42, 2009.