2010

Transformations of Gold Nanoparticles Investigated using Variable Temperature High-Resolution Transmission Electron Microscopy, N. P. Young, M.A. van Huis, H.W. Zandbergen, H. Xu, A.I. Kirkland, Ultramicroscopy, 110, 506, 2010.

Characterization of a Direct Detection Device Imaging Camera for Transmission Electron Microscopy, A-C. Milazzo, G. Moldovan, J. Lanman, L. Jin, J. C. Bouwer, S. Klienfelder, S. T. Peltier, M.H. Ellisman, A. I. Kirkland and N.-H. Xuong, Ultramicroscopy, 110, 744, 2010.

Measuring aberrations using the Ronchigram Contrast Transfer Function, A.R. Lupini, P. Wang, A.I. Kirkland, P.D. Nellist and S.J. Pennycook, Ultramicroscopy, 110, 891, 2010.

Energy Filtered Scanning Confocal Electron Microscopy using a double aberration-corrected electron microscope, P.Wang, G. Behan, M. Takeguchi, A. Hashimoto, K. Mitsuishi, M. Shimojo, A.I. Kirkland, P.D. Nellist, Phys. Rev. Letts, 104, 200801, 2010.

Self-assembled Hg//MoSI Nanowire complexes: the next generation of molecular scale interconnects V. Nicolosi, Z. Aslam, K. Sader, D. Vengust, N. P. Young, R. Doole, D. Mihailovic, A. L. Bleloch, N. Grobert, A. I. Kirkland,P. D. Nellist, New J. Chem., 34, 2241, 2010.

Exceeding Conventional Resolution Limits in High Resolution Transmission Electron Microscopy Using Tilted Illumination and Exit-Wave Restoration, A. I. Kirkland, S. J. Haigh, H. Sawada, Microsc. Microanal. 16, 409, 2010.

Structural Characterization of Interfaces in Epitaxial Fe/MgO/Fe Magnetic Tunnel Junctions by Transmission Electron Microscopy, C. Wang, S. G. Wang, L.Y. Chang,S. –Y. Choi, A. I. Kirkland,A. K. Petford-Long,R. C. C. Ward, and A. Kohn, Phys. Rev. B, 82, 024428, 2010.

Finding Phase Information in the Darkness S. J.Haigh, A. I. Kirkland, J. Phys: Conf. Ser. EMAG09, 241, 012013, 2010.

Variable Temperature Investigation of the Atomic Structure of Gold Nanoparticles N. P. Young, M.A. van Huis, H.W. Zandbergen, H. Xu, A.I. Kirkland, J. Phys: Conf. Ser. EMAG09, 241 012095, 2010.

Experimental Setup for Energy-Filtered Scanning Confocal Electron Microscopy (EFSCEM) in a Double Aberration-Corrected Transmission Electron Microscope P.Wang, G. Behan, A.I. Kirkland, and P.D. Nellist, J. Phys: Conf. Ser. EMAG09, 241, 012012, 2010.

Imaging Electron Detectors for Low-Voltage TEM, G. Moldovan and A.I. Kirkland, J. Phys: Conf. Ser. EMAG09, 241, 012009, 2010.

Novel Applications of the Oxford-JEOL Aberration-Corrected Electron Microscope P.D.Nellist and A.I.Kirkland, Phil Mag, 90, 4751, 2010.

Recording Low Spatial Frequencies While Maintaining Information Limit Resolution Using the TEAM – 1 Microscope, S. J. Haigh, B. Jiang, D. Alloyeau, C. Kisielowski, A. I. Kirkland, Microscopy and Microanalysis, 16(S2), 524, 2010.

Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration Corrected Microscope, A. Hasimoto, P. Wang, M. Shimojo, K. Mitsuishi, A. I. Kirkland, P. D. Nellist, M. Takeguchi, Microscopy and Microanalysis, 16(S2), 1888, 2010.

Processing and Aberration Corrected Imaging of Novel Low Dimensional Nanostructures, V. Nicolosi, Z. Aslam, J. Kim, O. L. Krivanek, M. F. Chisholm, T. J. Pennycook, A. I. Kirkland, N. Grobert, P. D. Nellist, Microscopy and Microanalysis, 16(S2), 76, 2010.

Three Dimensional Characterisation of a Silica Hollow Sphere with an iron Oxide Core by Annular dark Field Scanning Confocal Electron Microscopy, M. Takeguchi, M. Okuda, A. Hashimoto, K. Mitsuishi, M. Shimojo, X. Zhang, P. Wang, P. D. Nellist, A. I. Kirkland, Microscopy and Microanalysis, 16(S2), 1836, 2010.

Three Dimensional Resolution Limits and Image Contrast mechanisms in Scanning Confocal Electron Microscopy, P. D. Nellist, P. Wang, G. Behan, A. I. Kirkland, A. Hashimoto, M. Shimojo, K. Mitsuishi, M. Takeguchi, E. Cosgriff, A. J. D’Alfonso, L. J. Allen, S. D. Findlay, Microscopy and Microanalysis, 16(S2), 1834, 2010.

Surface Roughening and Partial Melting of Au Nanoparticles Observed with In-Situ High Resolution Transmission Electron Microscopy, M. A. van Huis, N. P. Young, G. Pandraud, A. I. Kirkland, H. W. Zandbergen Proceedings of the 17th International Microscopy Congress, Rio, Ed. G. Solorzano and W. de Souza, 2010.

DUOS - A Two-Speed Electron Imager Within the Same Pixel Array, T. Anaxagoras, N. Allinson, G. Riley, G. Moldovan, A. I. Kirkland, J. M. Rodenburg, Proceedings of the 17th International Microscopy Congress, Rio, Ed. G. Solorzano and W. de Souza, 2010.

Development of a 200 kV Aberration Corrected Analytical Electron Microscope Equipped with a Monochromator, M. Mukai, K. Omoto, A. Ikeda, T. Kaneyama, N. Young, P. Nellist, A. I. Kirkland, Proceedings of the 17th International Microscopy Congress, Rio, Ed. G. Solorzano and W. de Souza, 2010.

Energy Filtered Scanning Confocal Electron Microscopy (EF-SCEM), P. Wang, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, A. I. Kirkland, P. D. Nellist, Proceedings of the 17th International Microscopy Congress, Rio, Ed. G. Solorzano and W. de Souza, 2010.