2012

Performance and Early Applications of a Versatile Double Aberration-Corrected JEOL-2200FS FEG TEM/STEM at Aalto University, H. Jiang, J. Ruokolainen, N. P. Young, A. Nasibulin, T. Oikawa, A. I. Kirkland, E. I. Kauppinen, Micron, 43(4), 545, 2012

Toward Electron Exit Wave Tomography of Amorphous Materials at Atomic Resolution K. Borisenko; G. Moldovan; A. I. Kirkland; D. Van Dyck, H-Y Tang; F-R. Chen, J. Alloys and Compounds, 536S, S94, 2012.

Three-Dimensional Observation of SiO2 Hollow Spheres with a Double-Shell Structure Using Aberration Corrected Scanning Confocal Electron Microscopy, X. Zhang, M. Takeguchi, A. Hashimoto, .K. Mitsuishi, P. Wang, P. D. Nellist, A. I. Kirkland, M. Tezuka, and M. Shimojo, J. Electron Microsc., doi:10.1093/jmicro/dfs039, 2012.

Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x~0.11) M. Klingstedt, M. Sundberg, L. Eriksson, S. Haigh, A. Kirkland, D. GrĂ¼ner, A. De Backer, S. Van Aert and O. Terasaki, Z. Krist, doi:10.1524/zkri. 2012.1517, 2012.

Characterisation of a Counting Imaging Detector for Electron Detection in the Energy Range 10-20keV, G. Moldovan; I. Sikharulidze; J. Matheson; G. Derbyshire; A. I Kirkland, J. P Abrahams, Nuclear Instruments and Methods in Physics Research, 681, 21, 2012

Three Dimensional Elemental Mapping of Hollow Fe3O4@SiO2 Mesoporous Spheres Using Scanning Confocal Electron Microscopy, P. Wang, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, Angus I. Kirkland, and Peter D. Nellist, Appl. Phys. Letts,. 100, 213117, 2012.

Chromatic Confocal Electron Microscopy with a Finite Pinhole Size, P Wang, A I Kirkland and P D Nellist, Journal of Physics: Conference Series 371, 012002, 2012.

Towards 3D Structural Information from Quantitative Electron Exit Wave Analysis K B Borisenko, G Moldovan, A I Kirkland, A Wang, D Van Dyck and F-R Chen, Journal of Physics: Conference Series 371, 012057, 2012.

'Ex-Situ' Annealing and Structural Transformations in Gold Nanoparticles K E MacArthur, N P Young, J W Critchell and A I Kirkland, Journal of Physics: Conference Series 371, 012068, 2012.

Direct Measurement of the Crystallographically Sensitive Atomic Termination of Nanophase Cerium Dioxide, N P Young, S J Haigh, H Sawada, K Takayanagi and A I Kirkland, Journal of Physics: Conference Series 371, 012072, 2012.

Dislocation Driven Dynamics in Graphene, J. H. Warner, E. R. Margine, M. Mukai, A. R. Robertson, F. Giustino, A. I. Kirkland, Science, 337, 209,2012.

Atomic Structure of ABC Rhombohedral Stacked Trilayer Graphene, J. H. Warner, M. Mukai, A. I. Kirkland, ACS Nano, 6,5680, 2012.

The Identification of Inner Tube Defects in Double-Wall Carbon Nanotubes, C. S. Allen, A. W. Robertson, A. I. Kirkland, J. H. Warner, Small, 8(24), 3810, 2012.

Multi-scale order in amorphous transparent oxide thin filmsA. Yan, T. Sun, K. B. Borisenko, D. B. Buchholz, R. P. H. Chang, A. I. Kirkland, V. P. Dravid, J. Appl. Phys., 112, 054907 2012.

Advances in the Technology and Applications of High-Resolution Transmission Electron Microscopy for Materials Science, A. Kirkland and N. Young, Microscopy and Analysis, 25th Anniversary Issue September, 2012.

Spacial Control of Defect Creation in Graphene at the Nanoscale, A. W. Robertson,C. S. Allen, Y.A. Wu, K. He, J. Olivier, J. Neethling, A. I. Kirkland, J. H. Warner, Nature Communications, 3, 1144, 2012.

Three-dimensional Analysis of Nanoparticles on a Carbon Support using Aberration Corrected Scanning Confocal Electron Microscopy,A. Hashimoto, P. Wang, M. Shimojo, K. Mitsuishi, P. D. Nellist, A. I. Kirkland, M. Takeguchi, Appl. Phys. Letts, 101, 253108,2012.