2013

Gold-Palladium Core-Shell Nanocrystals with Size and Shape Control Optimised for Catalytic Performance, A. M. Henning, J. Watt, P. J. Miedziak, S. Cheong, M. Santonastaso, M. Song, Y. Takeda, A. I. Kirkland, S. H. Taylor and R. D. Tilley, Angew. Chem., 52, 1477, 2013.

Impurity induced non-bulk stacking in chemically exfoliated h-BN nanosheets  A. Shmeliov, J. S. Kim, K. B. Borisenko, P. Wang, E. Okunishi, M. Shannon, A. I. Kirkland, P. D. Nellist and V. Nicolosi, Nanoscale, 5, 2290, 2013.

Deterministic Single Shot Coherent Diffractive Imaging at sub-Angstrom Resolution, A. J. Morgan, A. J. D'Alfonso, P. Wang, H. Sawada, A. I. Kirkland, and L. J. Allen, Phys. Rev. B., doi:10.1103/PhysRevB.87.094115, 2013.

Structural Reconstruction of the Graphene Monovacancy, A. W. Robertson,B. Montanari, K. He, C. S. Allen, Y. A. Wu, N. M. Harrison, A. I. Kirkland,and Jamie H. Warner, ACS Nano, doi: 10.1021/nn401113r, 2013

Dynamics of Single Fe Atoms in Graphene Vacancies A. W. Robertson, C. S. Allen, Y. A. Wu, K. He, J. Kim,J. Olivier, J. Neethling, A. I. Kirkland, and J. H. Warner, Nano Letts. 13, 1468, 2013.

A Study of Commercial Nanoparticulate γ-Al2O3 Catalyst Supports, Y Rozita, R Brydson, T P Comyn, A. Scott, C Hammond, A Brown, S. Chauruka, A. Hassanpour, N P Young, A I Kirkland, H. Sawada and R.I.Smith, Chem. Cat. Chem., doi: 10.1002/cctc.201200880, 2013.

Recording Low Spatial Frequencies while Maintaining Information Limit Resolution, S.J Haigh, B. Jiang, D. Alloyeau, C. Kisielowski and A.I.Kirkland, Ultramicroscopy, 133, 26, 2013.

Direct Detection of Electron Backscatter Diffraction Patterns, Angus J Wilkinson, Grigore Moldovan, T Benjamin Britton, Robert Clough, Angus I Kirkland, Phys. Rev. Letts, 111, 065506, 2013

Assessing the Precision of Strain Measurements using Electron Backscatter Diffraction, Part 1: Detector Assessment, T.B. Britton, J. Jiang, R. N. Clough, E. Tarleton, A.I. Kirkland and A.J. Wilkinson, Ultramicroscopy, doi:10.1016/j.ultramic.2013.08.005,  2013.

Assessing the Precision of Strain Measurements using Electron Backscatter Diffraction, Part 2: Experimental Demonstration, T.B. Britton, J. Jiang, R. N. Clough, E. Tarleton, A.I. Kirkland and A.J. Wilkinson, Ultramicroscopy, doi:10.1016/j.ultramic.2013.08.006, 2013.

Bond Length and Charge Density Variations within Extended Arm Chair Defects in GrapheneJ. H. Warner, G.-D. Lee, K. He, A. W. Robertson and A. I. Kirkland, ACS Nano, 7 (11), 9860–9866, 2013.

Contrast in Atomically Resolved EF-SCEM Imaging, P. Wang, A. J. D’Alfonso, A. Hashimoto,A. J. Morgan, M. Takeguchi, K. Mitsuishi, M. Shimojo, A I. Kirkland, L. J. Allen and P. D. Nellist, Ultramicroscopy, 134, 185-192, 2013.