2017
Aberration Measurement in the Probe-Forming System of an Electron Microscope using Two-Dimensional Materials, H. Sawada, C. S. Allen, and A. I. Kirkland, Ultramicroscopy, 182, 195, 2017>
Characterisation of the Medipix3 detector for 60 and 80 keV electrons. J.A. Mir, R. Clough, R. MacInnes, C. Gough, R. Plackett, I. Shipsey, H. Sawada, I. MacLaren, R. Ballabriga, D. Maneuski, V. O’Shea, D. McGrouther, A.I. Kirkland, Ultramicroscopy, 182, 44, 2017>
Snapshot 3D Electron Imaging of Structural Dynamics, L.-G Chen, J. Warner, A. I. Kirkland, F-R. Chen, D. Van Dyck, Nature Sci. Rep., 7 10839, 2017 Electron Ptychographic Diffractive Imaging of Light Boron Atoms in LaB6 Crystals, P. Wang, F. Zhang, S. Gao, M. Zhang, H. Sawada and A. I. Kirkland, Nature Sci. Rep., 7, 2857, 2017 Orientation Dependent Interlayer Stacking Structure in Bilayer MoS2 Domains, S. Wang, H. Sawada, C. S. Allen, A. I. Kirkland, J. H. Warner, Nanoscale, 9, 13060, 2017 Atomically Flat Zigzag Edges in Monolayer MoS2 by In-situ Thermal Annealing, Q. Chen, H. Li, W. Xu, S. Wang, H. Sawada, C. S. Allen, A. W. Robertson, A. I. Kirkland, J. C. Grossman, J. H. Warner, Nano Letts., 17, 5502, 2017 Atomic Structure and Formation Mechanism of Sub-Nanometer Pores Arrays in 2D Monolayer MoS2, S. Wang, H. Li, H. Sawada, C. S. Allen, A. I. Kirkland, J. C. Grossman, J. H. Warner, Nanoscale,9, 6417, 2017 Characterisation of Thin Film Displacements in the Electron Microscope, H. Sawada, R. Ramlau, M. Danaie, C. S. Allen, A. I. Kirkland, Appl. Phys. Lett. 111, 203104, 2017