2017

Aberration Measurement in the Probe-Forming System of an Electron Microscope using Two-Dimensional Materials, H. Sawada, C. S. Allen, and A. I. Kirkland, Ultramicroscopy, 182, 195, 2017>

Characterisation of the Medipix3 detector for 60 and 80 keV electrons. J.A. Mir, R. Clough, R. MacInnes, C. Gough, R. Plackett, I. Shipsey, H. Sawada, I. MacLaren, R. Ballabriga, D. Maneuski, V. O’Shea, D. McGrouther, A.I. Kirkland, Ultramicroscopy, 182, 44, 2017>

Snapshot 3D Electron Imaging of Structural Dynamics, L.-G Chen, J. Warner, A. I. Kirkland, F-R. Chen, D. Van Dyck, Nature Sci. Rep., 7 10839, 2017

Electron Ptychographic Diffractive Imaging of Light Boron Atoms in LaB6 Crystals, P. Wang, F. Zhang, S. Gao, M. Zhang, H. Sawada and A. I. Kirkland, Nature Sci. Rep., 7, 2857, 2017

Orientation Dependent Interlayer Stacking Structure in Bilayer MoS2 Domains, S. Wang, H. Sawada, C. S. Allen, A. I. Kirkland, J. H. Warner, Nanoscale, 9, 13060, 2017

Atomically Flat Zigzag Edges in Monolayer MoS2 by In-situ Thermal Annealing, Q. Chen, H. Li, W. Xu, S. Wang, H. Sawada, C. S. Allen, A. W. Robertson, A. I. Kirkland, J. C. Grossman, J. H. Warner, Nano Letts., 17, 5502, 2017

Atomic Structure and Formation Mechanism of Sub-Nanometer Pores Arrays in 2D Monolayer MoS2, S. Wang, H. Li, H. Sawada, C. S. Allen, A. I. Kirkland, J. C. Grossman, J. H. Warner, Nanoscale,9, 6417, 2017

Characterisation of Thin Film Displacements in the Electron Microscope, H. Sawada, R. Ramlau, M. Danaie, C. S. Allen, A. I. Kirkland, Appl. Phys. Lett. 111, 203104, 2017