Electron Detection

Current imaging devices for transmission electron microscopy place a variety of un-necessary limitations on speed, efficiency and dynamic range. These limitations result primarily because of their principle of detection and little can be achieved by altering the present detectors. A new approach based on particle detection is taken here, with the the aim of recording the position of each electron arriving at the detection plane. Frames can then be easily constructed from this data, with much shorter and flexible integration time and unlimited dynamic range. Particle detectors also allow a much better control over the modulation transfer function, with substantial improvements in detection efficiency.

Experiments that will benefit from such detectors are in the areas of in-situ studies, quantitative transmission electron microscopy and electron microscopy of biological specimens.